Volume 2021 Issue 1
Aug.  2021
Turn off MathJax
Article Contents
Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. 2021: THz-Enhanced DC Ultrafast Electron Diffractometer. Ultrafast Science, 2021(1). doi: 10.34133/2021/9848526
Citation: Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. 2021: THz-Enhanced DC Ultrafast Electron Diffractometer. Ultrafast Science, 2021(1). doi: 10.34133/2021/9848526

THz-Enhanced DC Ultrafast Electron Diffractometer

doi: 10.34133/2021/9848526
Funds:

This work has been supported by the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013) through the Synergy Grant AXSIS (609920), Project KA908-12/1 of the Deutsche Forschungsgemeinschaft, the Cluster of Excellence “CUI: Advanced Imaging of Matter” of the Deutsche Forschungsgemeinschaft (DFG)—EXC 2056—project ID 390715994, and the Accelerator on a Chip Program (ACHIP) funded by the Gordon and Betty Moore Foundation (GBMF4744).

  • Received Date: 2021-04-11
  • Rev Recd Date: 2021-06-25
  • Publish Date: 2021-08-11
  • Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.

  • loading
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views (68) PDF downloads(1) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return